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Volumn , Issue , 2000, Pages 496-499

Improvement of flicker noise in lateral asymmetric channel N-MOSFETs for sub-micron analog applications

Author keywords

[No Author keywords available]

Indexed keywords

SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE;

EID: 84907844008     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2000.194823     Document Type: Conference Paper
Times cited : (3)

References (7)
  • 2
    • 84907891995 scopus 로고    scopus 로고
    • Implications of pocket optimization on analog performance in deep sub-micron CMOS
    • R. F. M. Roes, A. C. M. C. van Brandenburg, A. H. Montree, and P. H. Worlee, Implications of pocket optimization on analog performance in deep sub-micron CMOS , ESSDERC Proc., pp. 176-179, 1999.
    • (1999) ESSDERC Proc. , pp. 176-179
    • Roes, R.F.M.1    Van Brandenburg, A.C.M.C.2    Montree, A.H.3    Worlee, P.H.4
  • 3
    • 0003004771 scopus 로고    scopus 로고
    • Channel engineering for high speed sub-1.0V power supply deep submicron CMOS
    • B. Cheng, A. Inani, R. Rao, and J. C. S. Woo, Channel engineering for high speed sub-1.0V power supply deep submicron CMOS , VLSI Symp. Tech. Dig., pp. 5-6, 1999.
    • (1999) VLSI Symp. Tech. Dig. , pp. 5-6
    • Cheng, B.1    Inani, A.2    Rao, R.3    Woo, J.C.S.4
  • 5
    • 0031120671 scopus 로고    scopus 로고
    • Potential design and transport property of 0.1-m MOSFET with asymmetric channel profile
    • S. Odanaka and A. Hiroki, Potential Design and Transport Property of 0.1-m MOSFET with Asymmetric Channel Profile , IEEE Trans. on Electron Dev., Vol. 44, pp. 595-600, 1997.
    • (1997) IEEE Trans. on Electron Dev. , vol.44 , pp. 595-600
    • Odanaka, S.1    Hiroki, A.2
  • 7
    • 0032678739 scopus 로고    scopus 로고
    • On the f licker noise in submicron silicon MOSFETs
    • E. Simeon, C. Claeys, On the f licker noise in submicron silicon MOSFETs ,Solid State Electron., pp. 865-882, Vol. 43, 1999.
    • (1999) Solid State Electron. , vol.43 , pp. 865-882
    • Simeon, E.1    Claeys, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.