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Volumn 45, Issue 2, 2001, Pages 309-314
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Characteristics and comparison of In0.49Ga0.51P/InGaAs single and double delta-doped pseudomorphic high electron mobility transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CURRENT DENSITY;
ELECTRIC BREAKDOWN OF SOLIDS;
ENERGY GAP;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DOPING;
CARRIER CONFINEMENT;
HIGH CURRENT DRIVABILITY;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0035247262
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(01)00005-3 Document Type: Article |
Times cited : (15)
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References (17)
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