New model for thermal channel noise of deep submicron MOSFET's and its application in RF-CMOS design

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2000, Pages 150-153

  Knoblinger, Gerhard ^a   Klein, Peter ^a   Tiebout, Marc ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COMPUTER SOFTWARE; HOT CARRIERS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

SOFTWARE PACKAGE SPICE; THERMAL CHANNEL NOISE;

MOSFET DEVICES;

EID: 0033712918     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)