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Advanced Optical Materials

Volumn 2, Issue 4, 2014, Pages 382-388

Scaling rules of SERS intensity

(5) Nishijima, Yoshiaki a Hashimoto, Yoshikazu a Rosa, Lorenzo b,c Khurgin, Jacob B d Juodkazis, Saulius b,c

a YOKOHAMA NATIONAL UNIVERSITY (Japan)

b SWINBURNE UNIVERSITY OF TECHNOLOGY (Australia)

c MELBOURNE CENTRE FOR NANOFABRICATION (Australia)

d Johns Hopkins University (United States)

Author keywords

Electromagnetic field enhancements; Plasmonics; Spectroscopy; Surface enhanced Raman scattering

Indexed keywords

EID: 84907300484 PISSN: None EISSN: 21951071 Source Type: Journal
DOI: 10.1002/adom.201300493 Document Type: Article

Times cited : (49)

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