Wavelength dependence of Pockels effect in strained silicon waveguides

Optics Express

Volumn 22, Issue 18, 2014, Pages 22095-22100

  Damas, Pedro ^a   Le Roux, Xavier ^a   Le Bourdais, David ^a   Cassan, Eric ^a   Marris Morini, Delphine ^a   Izard, Nicolas ^a   Maroutian, Thomas ^a   Lecoeur, Philippe ^a   Vivien, Laurent ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NITROGEN COMPOUNDS; NONLINEAR OPTICS; OPTICAL WAVEGUIDES; SILICON NITRIDE;

OPTICAL SUSCEPTIBILITY; POCKELS EFFECT; SECOND ORDER OPTICAL NONLINEARITY; SECOND ORDERS; SILICON WAVEGUIDE; STRAIN DISTRIBUTIONS; WAVEGUIDE WIDTHS; WAVELENGTH DEPENDENCE;

STRAINED SILICON;

EID: 84907289331     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.022095     Document Type: Article

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