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Volumn 481, Issue 1-3, 2001, Pages 105-112
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Bulk and surface contributions to second-order susceptibility in crystalline and porous silicon by second-harmonic generation
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Author keywords
Ellipsometry; Porous solids; Second harmonic generation; Semi empirical models and model calculations; Semiconducting surfaces; Silicon
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Indexed keywords
CRYSTALLINE MATERIALS;
ELLIPSOMETRY;
LIGHT REFLECTION;
MATHEMATICAL MODELS;
POROUS SILICON;
SECOND HARMONIC GENERATION;
SEMICONDUCTOR DOPING;
NONLINEAR REFLECTION COEFFICIENTS;
OPTICAL CONSTANTS;
SPECTROSCOPIC ELLIPSOMETRY;
SILICON WAFERS;
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EID: 0035838078
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01004-4 Document Type: Article |
Times cited : (53)
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References (30)
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