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Volumn 481, Issue 1-3, 2001, Pages 105-112

Bulk and surface contributions to second-order susceptibility in crystalline and porous silicon by second-harmonic generation

Author keywords

Ellipsometry; Porous solids; Second harmonic generation; Semi empirical models and model calculations; Semiconducting surfaces; Silicon

Indexed keywords

CRYSTALLINE MATERIALS; ELLIPSOMETRY; LIGHT REFLECTION; MATHEMATICAL MODELS; POROUS SILICON; SECOND HARMONIC GENERATION; SEMICONDUCTOR DOPING;

EID: 0035838078     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01004-4     Document Type: Article
Times cited : (53)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.