Atom-probe tomographic study of interfaces of Cu2ZnSnS4photovoltaic cells

Applied Physics Letters

Volumn 105, Issue 9, 2014, Pages

  Tajima, S ^a   Asahi, R ^a   Isheim, D ^b   Seidman, D N ^b   Itoh, T ^a   Hasegawa, M ^a   Ohishi, K ^a  

^a Rd Management Section   (Japan)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE; TOMOGRAPHIC;

EID: 84907015248     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4894858     Document Type: Article

References (19)

1. K. Ito and T. Nakazawa, Jpn. J. Appl. Phys., Part 1 27, 2094 (1988). 10.1143/JJAP.27.2094
2. H. Katagiri, K. Jimbo, S. Yamada, T. Kamimura, W. S. Maw, T. Fukano, T. Ito, and T. Motohiro, Appl. Phys. Express 1, 041201 (2008). 10.1143/APEX.1.041201
3. B. Shin, O. Gunawan, Y. Zhu, N. A. Bojarczuk, S. J. Chey, and S. Guha, Prog. Photovoltaics 21, 72-76 (2013). 10.1002/pip.1174
4. H. Hiroi, N. Sakai, and H. Sugimoto, in 26th European Photovoltaic Solar Energy Conference and Exhibition (2011), p. 2448.
5. T. Fukano, S. Tajima, and T. Ito, Appl. Phys. Express 6, 062301 (2013). 10.7567/APEX.6.062301
6. P. Reinhard, A. Chirila, P. Bloesch, F. Pianezzi, S. Nishiwaki, S. Buecheler, and A. N. Tiwari, IEEE J. Photovoltaics 3, 572-580 (2013). 10.1109/JPHOTOV.2012.2226869
7. T. Nakada and A. Kunioka, Appl. Phys. Lett. 74, 2444 (1999). 10.1063/1.123875
8. K. Hiepko, J. Bastek, R. Schlesiger, G. Schmitz, R. Wuerz, and N. A. Stolwijk, Appl. Phys. Lett. 99, 234101 (2011). 10.1063/1.3665036
9. B. Gault, M. P. Moody, J. M. Cairney, and S. P. Ringer, Atom Probe Microscopy, Springer Series in Materials Science Vol. 160 (Springer, New York, Heidelberg, Dordrecht, London, 2012).
10. O. C. Hellman, J. A. Vandenbroucke, J. Rusing, D. Isheim, and D. N. Seidman, Microsc. Microanal. 6, 437 (2000).
11. M. Hasegawa, S. Tajima, T. Ito, and T. Fukano, in PVSEC-22 Technical Digest (2012), presentation number: 3-O-23.
12. S. Kijima and T. Nakada, Appl. Phys. Express 1, 075002 (2008). 10.1143/APEX.1.075002
13. T. Scwarz, O. Cojocaru-Miredin, P. Choi, M. Mousel, A. Redinger, S. Siebentritt, and D. Raabe, Appl. Phys. Lett. 102, 042101 (2013). 10.1063/1.4788815
14. N. Korozlu, K. Colakoglu, and E. Deligoz, Phys. Status Solidi B 247, 1214 (2010). 10.1002/pssb.200945445
15. R. W. Balluffi, S. M. Allen, and W. C. Carter, Kinetics of Materials (John Wiley & Sons, Inc., Hoboken, New Jersey, 2005), p. 168.
16. T. Maeda, S. Nakamura, and T. Wada, Jpn. J. Appl. Phys., Part 1 51, 10NC11 (2012). 10.7567/JJAP.51.10NC11
17. A. Nagoya, R. Asahi, R. Wahl, and G. Kresse, Phys. Rev. B 81, 113202 (2010). 10.1103/PhysRevB.81.113202
18. S. Tajima, H. Katagiri, K. Jimbo, N. Sugimoto, and T. Fukano, Appl. Phys. Express 5, 082302 (2012). 10.1143/APEX.5.082302
19. A. Nagoya, R. Asahi, and G. Kresse, J. Phys.: Condens. Matter 23, 404203 (2011). 10.1088/0953-8984/23/40/404203