Crystalline structures of YAlO3 single crystal at high temperatures

Proceedings of the International Symposium on Electrical Insulating Materials

Volumn , Issue , 2014, Pages 208-211

  Inoue, Takahiro ^a   Morimoto, Takaaki ^a   Kaneko, Shoji ^a   Horii, Yosuke ^a   Ohki, Yoshimichi ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

Structural changes; Thermal annealing; X ray diffractometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; INSULATING MATERIALS; LIGHT ABSORPTION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE STRUCTURE; GATE INSULATING MATERIALS; HIGH-TEMPERATURE ANNEALING; PEROVSKITE STRUCTURES; STRUCTURAL CHANGES; SURFACE PROFILOMETERS; THERMAL-ANNEALING;

ANNEALING;

EID: 84906536790     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEIM.2014.6870755     Document Type: Conference Paper

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