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Volumn , Issue , 2014, Pages 1-6

Building trusted ICs using split fabrication

Author keywords

Circuit obfuscation; Design for trust; Hardware security; Split fabrication

Indexed keywords

DESIGN; FOUNDRIES; HARDWARE; INTEGRATED CIRCUITS; NETWORK SECURITY; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 84905991814     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HST.2014.6855559     Document Type: Conference Paper
Times cited : (105)

References (16)
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  • 2
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    • Skorobogatov, S.1
  • 6
    • 84905964246 scopus 로고    scopus 로고
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    • J. Rajendran et al., "Is split manufactunng secure?," DATE, March 2013
    • (2013) DATE
    • Rajendran, J.1
  • 7
    • 84905973421 scopus 로고    scopus 로고
    • Securmg computer hardware using 3D mtegrated circuit (IC) technology and split manufactunng for obifiscation
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    • F. Imeson et al., "Securmg computer hardware using 3D mtegrated circuit (IC) technology and split manufactunng for obifiscation," USENLX SEC, August 2013
    • (2013) Usenlx Sec
    • Imeson, F.1
  • 9
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    • Hardware secunty: Threat models and metncs
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    • M. Rostami et al., "Hardware Secunty: Threat Models and Metncs," ICCAD, Nov, 2013
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    • Rostami, M.1
  • 10
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    • Efficient and secure intellectual property (ip) design for split fabrication
    • May
    • K. Vaidyanathan et al., "Efficient and Secure Intellectual Property (IP) Design for Split Fabrication," HOST, May 2014
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    • Vaidyanathan, K.1
  • 11
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    • Reverse engineermg in the semiconductor industry
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    • R. Torrance et al., "Reverse Engineermg in the Semiconductor Industry," CICC, Sep, 2007
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  • 16
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    • Detecting reliability attacks during split fabrication using test-only beol stack
    • June
    • K. Vaidyanathan et al., "Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack," DAC, June 2014.
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    • Vaidyanathan, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.