TEM and XPS studies on CdS/CIGS interfaces

Journal of Physics and Chemistry of Solids

Volumn 75, Issue 12, 2014, Pages 1279-1283

  Han, Jun Feng ^a,c   Liao, Cheng ^b   Cha, Li Mei ^b   Jiang, Tao ^b   Xie, Hua Mu ^b   Zhao, Kui ^b   Besland, Marie Paule ^a  

^a UNIVERSITÉ DE NANTES   (France)

^b PEKING UNIVERSITY   (China)

^c BEIJING INSTITUTE OF TECHNOLOGY   (China)

Author keywords

A. Chalcogenides; A. Interfaces; A. Thin films; C. Electron microscopy; C. Photoelectron spectroscopy

Indexed keywords

CADMIUM SULFIDE; INORGANIC COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

CD PARTIAL ELECTROLYTE; CHEMICAL-BATH DEPOSITION; GALLIUM SELENIDES; METALLIC PRECURSOR; PROFILE MEASUREMENT; SELENIZATION PROCESS; SHARP INTERFACE; TEM OBSERVATIONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84905663481     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2014.06.002     Document Type: Article

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