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Volumn 49, Issue 1, 2014, Pages 187-192
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Investigation of Cu(In,Ga)Se2 polycrystalline growth: Ga diffusion and surface morphology evolution
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Author keywords
A. Chalcogenides; A. Thin films; B. Sputtering; C. Electron microscopy; C. Raman
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Indexed keywords
ANNEALING TREATMENTS;
AUGER ELECTRON SPECTROSCOPIES (AES);
C. RAMAN;
DOUBLE LAYER STRUCTURE;
ENERGY DISPERSIVE SPECTROSCOPIES (EDS);
FILM SURFACE MORPHOLOGY;
MORPHOLOGY EVOLUTION;
POLYCRYSTALLINE GROWTH;
ANNEALING;
AUGER ELECTRON SPECTROSCOPY;
ENERGY DISPERSIVE SPECTROSCOPY;
INDIUM;
INORGANIC COMPOUNDS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SELENIUM COMPOUNDS;
X RAY DIFFRACTION;
GALLIUM;
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EID: 84885340905
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/j.materresbull.2013.08.073 Document Type: Article |
Times cited : (13)
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References (29)
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