Comparative electrostatic force microscopy of tetra- and intra-molecular G4-DNA

Advanced Materials

Volumn 26, Issue 29, 2014, Pages 4981-4985

  Livshits, Gideon I ^a   Ghabboun, Jamal ^a   Borovok, Natalia ^b   Kotlyar, Alexander B ^b   Porath, Danny ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

DNA nanoelectronics; electrostatic force microscopy (EFM); G4 DNA; molecular electronics

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; MOLECULAR ELECTRONICS; NANOELECTRONICS;

DIFFERENT HEIGHTS; ELECTRICAL POLARIZABILITY; ELECTRICAL WIRES; ELECTROSTATIC FORCE MICROSCOPY;

DNA;

DNA; GUANINE QUADRUPLEX;

ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; COMPARATIVE STUDY; PROCEDURES; STATIC ELECTRICITY;

DNA; G-QUADRUPLEXES; MICROSCOPY, ATOMIC FORCE; MODELS, MOLECULAR; STATIC ELECTRICITY;

EID: 84905572620     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201401010     Document Type: Article

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