A switching diffusion model for lifetime estimation in randomly varying environments

IIE Transactions (Institute of Industrial Engineers)

Volumn 46, Issue 11, 2014, Pages 1227-1241

  Flory, John A ^a   Kharoufeh, Jeffrey P ^a   Gebraeel, Nagi Z ^b  

^a University of Pittsburgh   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

Degradation based reliability; random environment

Indexed keywords

INDUSTRIAL ENGINEERING;

CRITICAL THRESHOLD; DEGRADATION PROCESS; FIRST PASSAGE TIME; LIFETIME ESTIMATION; MARKOV CHAIN MONTE-CARLO; PARAMETER ESTIMATE; RANDOM ENVIRONMENT; SWITCHING DIFFUSION;

SWITCHING SYSTEMS;

EID: 84905240127     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2014.893400     Document Type: Article

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