Study of a stochastic failure model in a random environment

Journal of Applied Probability

Volumn 44, Issue 1, 2007, Pages 151-163

  Cha, Ji Hwan ^a   Mi, Jie ^b  

^a Pukyong National University   (South Korea)

^b FLORIDA INTERNATIONAL UNIVERSITY   (United States)

Author keywords

Baseline failure rate function; Compound failure rate function; Environmental condition; Failure process; Poisson shock process; Stochastic ordering

Indexed keywords

EID: 34247616688     PISSN: 00219002     EISSN: None     Source Type: Journal    
DOI: 10.1239/jap/1175267169     Document Type: Article

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