Stability of photoactive oxide semiconductors

ECS Transactions

Volumn 58, Issue 41, 2013, Pages 125-136

  Gakhar, Ruchi ^a   Chidambaram, Dev ^a  

^a UNIVERSITY OF NEVADA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; TITANIUM DIOXIDE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

DEPOSITION CYCLES; OXIDE SEMICONDUCTOR; PHOTOELECTROCHEMICAL MEASUREMENTS; PHOTOELECTROCHEMICAL PROPERTIES; POST DEPOSITION ANNEALING; STABILITY BEHAVIOR; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; ZNCDSE QUANTUM DOTS;

ELECTROCHEMISTRY;

EID: 84904907041     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/05841.0125ecst     Document Type: Conference Paper

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