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Volumn 105, Issue 2, 2014, Pages
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Kinetic model for electric-field induced point defect redistribution near semiconductor surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELDS;
OXIDE MINERALS;
POINT DEFECTS;
SEMICONDUCTOR DEVICES;
TITANIUM DIOXIDE;
BANDBENDING;
DEFECT INJECTIONS;
ELECTRIC FIELD INDUCED;
ISOTOPIC OXYGEN;
KINETIC MODELING;
NEAR SURFACES;
SEMI-CONDUCTOR SURFACES;
TEMPORAL DEPENDENCE;
PILES;
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EID: 84904732187
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.4890472 Document Type: Article |
Times cited : (13)
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References (19)
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