Graphene oxide and reduced graphene oxide studied by the XRD, TEM and electron spectroscopy methods

Journal of Electron Spectroscopy and Related Phenomena

Volumn 195, Issue , 2014, Pages 145-154

  Stobinski, L ^a,b   Lesiak, B ^a   Malolepszy, A ^c   Mazurkiewicz, M ^c   Mierzwa, B ^a   Zemek, J ^d   Jiricek, P ^d   Bieloshapka, I ^d  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b Nanomaterials Leszek Stobinski   (Poland)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^d INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Graphene oxide; Reduced graphene oxide; REELS; TEM; XPS; XRD

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; NANOSTRUCTURES; OXYGEN; REELS; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ELECTRONS; ENERGY DISSIPATION; MOLECULES;

AVERAGE DIAMETER; FEW-LAYER GRAPHENE; GRAPHENE LAYERS; GRAPHENE OXIDES; OXIDATION REACTIONS; REDUCED GRAPHENE OXIDES; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; XRD;

GRAPHENE;

EID: 84904710171     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2014.07.003     Document Type: Article

References (41)

1. J-H. Ahn, and J.H. Je J. Phys. D: Appl. Phys. 45 2012 103001 103014
2. Y.F. Hsiou, Y.J. Yang, L. Stobinski, W. Kuo, and C.D. Chen Appl. Phys. Lett. 84 2004 984 985
3. B.C. Brodie Ann. Chim. Phys. 59 1860 466 471
4. L. Staudenmaier Ber. Dtsch. Chem. Ges. 31 1898 1481 1487
5. U. Hofmann, E. Konig, and Z. Anorg Allg. Chem. 234 1937 311 336
6. U. Hofmann, and R. Hoist Ber. Dtsch. Chem. Ges. 72 1939 754 771
7. W.S. Hummers, and R.E. Offeman J. Am. Chem. Soc. 80 1958 1339
8. H. Song, L. Hao, Y. Tian, X. Wan, L. Zhang, and Y. Lv ChemPlusChem 77 2012 379 386
9. S. Rey, and F. Le Normand Thin Solid Films 519 2011 4426 4428
10. L-Z. Fan, J-L. Liu, R. Ud-Din, X. Yan, and X. Qu Carbon 50 2012 3724 3730
11. D. Yang, A. Velamakanni, G. Bozoklu, S. Park, M. Stoller, R.D. Piner, S. Stankovich, I. Jung, D.A. Field, C.A. Ventrice Jr., and R.S. Ruoff Carbon 47 2009 145 152
12. W.G. Hong, B.H. Kim, S.M. Lee, H.Y. Yu, Y.J. Yun, Y. Jun, J.B. Lee, and H.J. Kim Int. J. Hydrogen Energy 37 2012 7594 7599
13. C.D. Zangmeister Chem. Mater. 22 2012 5625 5629
14. Z. Lin, Y. Yao, Z. Li, Y. Liu, Z. Li, and C-P. Wong J. Phys. Chem. C 114 2010 14819 14825
15. Q. Zhuo, J. Gao, M. Peng, L. Bai, J. Deng, Y. Xia, Y. Ma, J. Zhong, and X-H. Sun Carbon 52 2013 559 564
16. S.W. Lee, C. Mattevi, M. Chhowalla, and R.M. Sankaran J. Phys. Chem. Lett. 3 2012 772 777
17. J. Campos-Delgado, J.M. Romo-Herrera, X. Jia, D.A. Cullen, H. Muramatsu, Y.A. Kim, T. Hayashi, Zh. Ren, D.J. Smith, Y. Okuno, T. Ohba, H. Kanoh, K. Kaneko, M. Endo, H. Terrones, M.S. Dresselhaus, and M. Terrones Nano Lett. 8 2008 2773 2778
18. M. Acik, C. Mattevi, C. Gong, G. Lee, K. Cho, M. Chhowalla, and Y.J. Chabal ACS Nano 4 2010 5861 5868
19. A. Lerf, H-Y. Heb, T. Riedl, M. Forster, and J. Klinowski Solid State Ionics 101-103 1997 857 862
20. A. Buchsteiner, A. Lerf, and J. Pieper J. Phys. Chem. B 110 2006 22328 22338
21. A. Lerf, A. Buchsteiner, J. Pieper, S. Schöttl, I. Dekany, T. Szabo, and H.P. Boehm J. Phys. Chem. Solids 67 2006 1106 1110
22. T. Eberlein, U. Bangert, R.R. Nair, R. Jones, M. Gass, A.L. Bleloch, K.S. Novoselov, A. Geim, and P.R. Briddon Phys. Rev. B: Condens. Matter 77 2008 233406 233414
23. P. Johari, and V.B. Shenoy ACS Nano 5 2011 7640 7647
24. Z. Xu, Y. Bando, L. Liu, W. Wang, X. Bai, and D. Golberg ACS Nano 5 2011 4401 4406
25. S.H. Shim, K.T. Kim, J.U. Lee, and W.H. Jo ACS Appl. Mater. Interfaces 4 2012 4184 4191
26. M. Wojdyr, Fityk: a General-Purpose Peak Fitting Program. FITYK 0.9.8 software.http://www.softpedia.com/progDownload/Fityk-Download-69770.html.
27. B.E. Warren Phys. Rev. 59 1941 693 698
28. S. Tougaard, Background Analysis of XPS/AES. QUASES Simple Background, ver. 2.2, Copyright 1994-2001; http://www.tougaard.com.
29. J.F. Moulder, W.F. Sticle, P.E. Sobol, and K.D. Bomben Handbook of X-ray Photoelectron Spectroscopy 1992 Perkin-Elmer Co. Eden Prairie, MN
30. C.D. Wagner, A.V., Naumkin, A. Kraut-Vass, J.W., Allison, C.J., Powell, J.R., Rumble, Jr., NIST X-ray Photoelectron Database, NIST SRD 20, ver. 4.1, online, PC.
31. Yu.V. Butenko, S. Krishnamurthy, A.K. Chakraborty, V.L. Kuznetsov, V.R. Dhanak, M.R.C. Hunt, and L. Šiller Phys. Rev. B: Condens. Matter 71 2005 075420 75510
32. Sh. Kundu, Y.-M. Wang, W. Xia, and M. Muhler J. Phys. Chem. C 112 2008 16869 16878
33. R.W.S. Kwok, XPS Peak Fitting Program for WIN95/98 XPSPEAK Version 4.1, Department of Chemistry, The Chinese University of Hong Kong, rmkwok@cuhk.edu.hk; http://www.uksaf.org/software.html, XPSPEAK4.1.
34. S. Yamamoto, H. Bluhm, K. Andersson, G. Ketteler, H. Ogasawara, M. Salmeron, and A. Nilsson J. Phys.: Condens. Matter 20 2008 184025 184038
35. T. Schiros, K.J. Andersson, L.G.M. Pettersson, A. Nilsson, and H. Ogasawara J. Electron. Spectrosc. Relat. Phenom. 177 2010 85 98
36. M. Nagasaka, H. Kondoh, K. Amemiya, T. Ohta, and Y. Iwasawa Phys. Rev. Lett. 100 2008 106101 106104
37. B.R. Stanmore, V. Tschamber, and J.-F. Brilhac Fuel 87 2008 131 146
38. L. Calliari, S. Fanczenko, and M. Filippi Carbon 45 2007 1410 1418
39. A. Jablonski, and J. Zemek Surf. Interface Anal. 41 2009 193 204
40. A. Jablonski, and C.J. Powell J. Vac. Sci. Technol. A: Vac. Surf. Films 27 2009 253 261
41. S. Tanuma, C.J. Powell, and D.R. Penn Surf. Interface Anal. 43 2011 689 713