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Volumn 29, Issue 8, 2014, Pages 1345-1353
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Comparison of 795 nm and 265 nm femtosecond and 193 nm nanosecond laser ablation inductively coupled plasma mass spectrometry for the quantitative multi-element analysis of glass materials
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCIUM;
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;
LASER ABLATION;
PARTICLE SIZE ANALYSIS;
SILICON;
ULTRASHORT PULSES;
CRUCIAL PARAMETERS;
ELEMENT CONCENTRATIONS;
INSTRUMENTAL PARAMETERS;
INTERNAL STANDARDS;
MULTIELEMENT ANALYSIS;
NANOSECOND LASER ABLATION;
OPERATING CONDITION;
REFERENCE MATERIAL;
GLASS;
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EID: 84904177302
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/c4ja00030g Document Type: Article |
Times cited : (39)
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References (34)
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