Focal-series reconstruction in low-energy electron microscopy

Microscopy and Microanalysis

Volumn 20, Issue 3, 2014, Pages 968-973

  Duden, Thomas ^a,b   Thust, Andreas ^a,b   Kumpf, Christian ^a,b   Tautz, F Stefan ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Section JARA FIT   (Germany)

Author keywords

low energy electron microscopy (LEEM); phase contrast imaging; phase retrieval

Indexed keywords

EID: 84903775572     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614000403     Document Type: Conference Paper

References (20)

1. COENE, W., THUST, A., OP DE BEECK, M. & VAN DYCK, D. (1996). Maximum likelihood method for focus-variation image reconstruction in high-resolution transmission electron microscopy. Ultramicroscopy 64, 109-135.
2. GLÖCKLER, K., SEIDEL, C., SOUKOPP, A., SOKOLOWSKI, M., UMBACH, E., BÖHRINGER, M., BERNDT, R. & SCHNEIDER, W.-D. (1998). Highly ordered structures and submolecular scanning tunnelling microscopy contrast of PTCDA and DM-PBDCI monolayers on Ag(111) and Ag(110). Surface Science 405, 1-20.
3. HÄUSLER, G. (1972). A method to increase the depth of focus by two step image processing. Optics Communications 6(1), 38-42.
4. KOSHIKAWA, T., SHIMIZU, H., AMAKAWA, R., IKUTA, T., YASUE, T. & BAUER, E. (2005). A new aberration correction method for photoemission electron microscopy by means of moving focus. J Phys Condens Matter 17(16), S1371.
5. KRÖGER, I., STADTMÜLLER, B., STADLER, C., ZIROFF, J., KOCHLER, M., STAHL, A., POLLINGER, F., LEE, T., ZEGENHAGEN, J., REINERT, F. & KUMPF, C. (2010). Submonolayer growth of copper-phthalocyanine on Ag(111). New J Phys 12(8), 083038.
6. LICHTE, H. (1991). Optimum focus for taking holograms. Ultramicroscopy 38, 13-22.
7. OP DE BEECK, M., VAN DYCK, D. & COENE, W. (1996). Wave function reconstruction in HRTEM: The parabola method. Ultramicroscopy 64(1-4), 167-183.
8. PANG, A.B., MÜLLER, TH., ALTMAN, M.S. & BAUER, ERNST (2009). Fourier optics of image formation in LEEM. J Phys Condens Matter 21(31), 314006.
9. SAXTON, W.O. (1994). What is the focus variation method? Is it new? Is it direct? Ultramicroscopy 55(2), 171-181.
10. SCHISKE, P. (1968). Proceedings of 4th European Conference on Electron Microscopy. Tipografia Poliglotta Vaticana, Rome, p. 145.
11. SCHISKE, P. (2002). Image reconstruction by means of focus series. J Microsc 207, 154.
12. SCHRAMM, S.M., PANG, A.B., ALTMAN, M.S. & TROMP, R.M. (2012). A contrast transfer function approach for image calculations in standard and aberration-corrected LEEM and PEEM. Ultramicroscopy 115, 88-108.
13. STADTMÜLLER, B., LÜFTNER, D., WILLENBOCKEL, M., REINISCH, E.M., SUEYOSHI, T., KOLLER, G., SOUBATCH, S., RAMSEY, M.G., PUSCHNIG, P., TAUTZ, F.S. & KUMPF, C. (2014a). Unexpected interplay of bonding height and energy level alignment at heteromolecular hybrid interfaces. Nature Communications 5, 3685.
14. STADTMÜLLER, B., HENNECKE, C., SOUBATCH, S., TAUTZ, F.S.&KUMPF, C. (2014b). Tailoring metal-organic hybrid interfaces: Heteromolecular structures on Ag(111). (to be published in 2014).
15. THUST, A. (2007). Focal-series reconstruction in HRTEM: Fundamentals and Applications. In 38th IFF Spring School 2007, Forschungszentrum Jülich, ISBN 978-3-89336-462-6.
16. THUST, A., COENE, W., OP DE BEECK, M. & VAN DYCK, D. (1996a). Focal-series reconstruction in HRTEM: Simulation studies on non-periodic objects. Ultramicroscopy 64, 211-230.
17. THUST, A., COENE, W., OP DE BEECK, M. & VAN DYCK, D. (1996b). Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64, 249-264.
18. THUST, A. & ROSENFELD, R. (1998). State of the art focal series reconstruction in HRTEM. Proceedings of the 14th International Congress of Electron Microscopy. Cancun, Mexico, (1), p. 119.
19. VAN GASTEL, R., SIKHARULIDZE, I., SCHRAMM, S., ABRAHAMS, J.P., POELSEMA, B., TROMP, R.M. & VAN DER MOLEN, S.J. (2009). Medipix 2 detector applied to low energy electron microscopy. Ultramicroscopy 110(1), 33-35.
20. YU, R.P., KENNEDY, S.M., PAGANIN, D.M. & JESSON, D.E. (2010). Phase retrieval low energy electron microscopy. Micron 41(3), 232-238.