Photoluminescence characterization of surface degradation mechanism in Cu(In,Ga)Se2 thin films grown on Mo/soda lime glass substrate

Japanese Journal of Applied Physics

Volumn 53, Issue 5 SPEC. ISSUE 1, 2014, Pages

  Shirakata, Sho ^a   Ohta, Hiroyuki ^a   Ishihara, Kouichi ^a   Takagi, Tatsuya ^a   Atarashi, Akiko ^a   Yudate, Shinji ^a  

^a EHIME UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DIFFUSION IN LIQUIDS; GALLIUM; GALLIUM ALLOYS; GLASS; LIME; SECONDARY ION MASS SPECTROMETRY; SELENIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; SODIUM; SOLAR CELLS; SUBSTRATES; THIN FILMS;

CIGS SOLAR CELLS; GLASS SUBSTRATES; IN-DEPTH PROFILE; PHOTOLUMINESCENCE CHARACTERIZATION; SECONDARY ION MASS SPECTROSCOPY; SPUTTERING CONDITIONS; SPUTTERING TEMPERATURE; SURFACE DEGRADATION;

COPPER;

EID: 84903307887     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.7567/JJAP.53.05FW11     Document Type: Conference Paper

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