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Volumn 4, Issue , 2014, Pages

Facile strain analysis of largely bending films by a surface-labelled grating method

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EID: 84903147536     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep05377     Document Type: Article
Times cited : (38)

References (40)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.