Principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS): A versatile method for the investigation of self-assembled monolayers and multilayers as precursors for the bottom-up approach of nanoscaled devices

Analytical Chemistry

Volumn 86, Issue 12, 2014, Pages 5740-5748

  Holzweber, Markus ^a   Heinrich, Thomas ^b   Kunz, Valentin ^b   Richter, Sebastian ^b   Traulsen, Christoph H H ^b   Schalley, Christoph A ^b   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PRINCIPAL COMPONENT ANALYSIS; SELF ASSEMBLED MONOLAYERS; SELF ASSEMBLY;

BOTTOM UP APPROACH; FUNCTIONAL SURFACES; LAYER BY LAYER SELF ASSEMBLY; LBL SELF ASSEMBLIES; NANO-SCALED DEVICES; NANOTECHNOLOGY APPLICATIONS; TEMPLATE FORMATION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

EID: 84902838155     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac500059a     Document Type: Article

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