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Volumn 369, Issue 1647, 2014, Pages

Mapping the continuous reciprocal space intensity distribution of X-ray serial crystallography

Author keywords

Free electron laser; Serial crystallography; Three dimensional diffraction

Indexed keywords

ASYMMETRY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DATA ACQUISITION; IONIZATION; LIGHT EFFECT;

EID: 84902668992     PISSN: 09628436     EISSN: 14712970     Source Type: Journal    
DOI: 10.1098/rstb.2013.0333     Document Type: Article
Times cited : (28)

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