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Volumn 46, Issue , 2014, Pages 13-17

Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al-Cr-Fe complex metallic alloys (CMAs)

(13) Beni, Alessandra a Ott, Noémie a Pawelkiewicz, Magdalena a Wardé, Micheline b Young, Kirsty c Bauer, Birgitta d Rajput, Parasmani e Detlefs, Blanka e Zegenhagen, Jörg e McGrath, Ronan c Barthés Labrousse, Marie Geneviève b Jeurgens, Lars P H a Schmutz, Patrik a

a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY (Switzerland)

b UNIVERSITÉ PARIS SUD (France)

c UNIVERSITY OF LIVERPOOL (United Kingdom)

d UNIVERSITY OF MUNICH (Germany)

e EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

Al alloys; Complex metallic alloys; Composition depth profiling; Electrochemical passivation; Hard X ray Photoelectron Spectroscopy (HAXPES); Oxide hydroxide

Indexed keywords

IRON COMPOUNDS; PASSIVATION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

AL-ALLOY; COMPLEX METALLIC ALLOYS; ELECTROCHEMICAL PASSIVATION; ELECTROCHEMICAL POLARISATION; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HAX-PES; SIMULTANEOUS ANALYSIS; THRESHOLD CONCENTRATIONS;

ALUMINUM;

EID: 84902595485 PISSN: 13882481 EISSN: None Source Type: Journal
DOI: 10.1016/j.elecom.2014.05.024 Document Type: Article

Times cited : (20)

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