Full depth profile of passive films on 316L stainless steel based on high resolution HAXPES in combination with ARXPS

Applied Surface Science

Volumn 258, Issue 15, 2012, Pages 5790-5797

  Fredriksson, W ^a   Malmgren, S ^a   Gustafsson, T ^a   Gorgoi, M ^b   Edstrom K ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

HAXPES; Passive film; Stainless steel; XPS

Indexed keywords

AUSTENITIC STAINLESS STEEL; CHEMICAL ANALYSIS; CHROMIUM; FILM THICKNESS; IRON OXIDES; PHOTOELECTRONS; PHOTONS; STAINLESS STEEL; X RAYS;

316 L STAINLESS STEEL; ACIDIC SOLUTIONS; CHEMICAL CONTENT; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HAX-PES; IRON CONCENTRATIONS; NON DESTRUCTIVE; PASSIVE FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84859164563     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.02.099     Document Type: Article

References (43)

1. I. Olefjord, and L. Wegrelius Surface-analysis of passive state Corros. Sci. 31 1990 89 98
2. C.O.A. Olsson, and D. Landolt Passive films on stainless steels - chemistry, structure and growth Electrochim. Acta 48 2003 1093 1104
3. Z. Chen, X. Guo, X. Zhang, and L. Huang Investigation of the effect of CrO42- and MoO42- on carbon steel corrosion using AFM and electrochemical techniques Werkstoffe Und Korrosion[[n1]]Mater. Corros. 60 2009 726 729
4. A. Stupnik, P. Frank, and M. Leisch Atom probe, AFM, and STM studies on vacuum-fired stainless steels Ultramicroscopy 109 2009 563 567
5. V. Maurice, G. Despert, S. Zanna, M.P. Bacos, and P. Marcus Self-assembling of atomic vacancies at an oxide/intermetallic alloy interface Nat. Mater. 3 2004 687 691
6. G.M. Bulman, and A.C.C. Tseung Ellipsometric study of passive film growth on stainless-steel Corros. Sci. 13 1973 531 544
7. J.J. FuentesGallego, E. Blanco, and L. Esquivias Ellipsometric characterization of an AISI 304 stainless steel protective coating Thin Solid Films 301 1997 12 16
8. I. Olefjord, B. Brox, and U. Jelvestam Surface-composition of stainless-steels during anodic-dissolution and passivation studied by Esca J. Electrochem. Soc. 132 1985 2854 2861
9. R. Kirchheim, B. Heine, H. Fischmeister, S. Hofmann, H. Knote, and U. Stolz The passivity of iron-chromium alloys Corros. Sci. 29 1989 899 917
10. P. Marcus, and I. Olefjord A round robin on combined electrochemical and Aes Esca characterization of the passive films on Fe-Cr and Fe-Cr-Mo alloys Corros. Sci. 28 1988 589 602
11. W. Fredriksson, K. Edstrom, and C.O. Olsson XPS analysis of manganese in stainless steel passive films on 1.4432 and the lean duplex 1.4162 Corros. Sci. 52 2010 2505 2510
12. I. Olefjord, and B.-O. Elfström The composition of the surface during passivation of stainless steels Corrosion 38 1982 46
13. B. Brox, and I. Olefjord Preferential dissolution of iron during polarization of stainless steels Stainless Steel, Gothenburg, Sweden 1984 The Institute of Metals London, UK
14. M. Gorgoi, S. Svensson, F. Schaefers, W. Braun, and W. Eberhardt Hard X-ray high kinetic energy photoelectron spectroscopy at the KMC-1 beamline at BESSY Eur. Phys. J. Spec. Topics 169 2009 221 225
15. F. Schaefers, M. Mertin, and M. Gorgoi KMC-1: a high resolution and high flux soft X-ray beamline at BESSY Rev. Sci. Instrum. 78 2007
16. M. Gorgoi, S. Svensson, F. Schaefers, G. Ohrwall, M. Mertin, P. Bressler, O. Karis, H. Siegbahn, A. Sandell, H. Rensmo, W. Doherty, C. Jung, W. Braun, and W. Eberhardt The high kinetic energy photoelectron spectroscopy facility at BESSY progress and first results Nucl. Instrum. Methods Phys. Res. Sect. Acc. Spectrum Ass. Equip. 601 2009 48 53
17. E. Holmstrom, W. Olovsson, I.A. Abrikosov, A.M.N. Niklasson, B. Johansson, M. Gorgoi, O. Karis, S. Svensson, F. Schaefers, W. Braun, G. Ohrwall, G. Andersson, M. Marcellini, and W. Eberhardt Sample preserving deep interface characterization technique Phys. Rev. Lett. 97 2006
18. E. Lewin, P.O.A. Persson, M. Lattemann, M. Stuber, M. Gorgoi, A. Sandell, C. Ziebert, F. Schaefers, W. Braun, J. Halbritter, S. Ulrich, W. Eberhardt, L. Hultman, H. Siegbahn, S. Svensson, and U. Jansson On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films Surf. Coat. Technol. 202 2008 3563 3570
19. S. Granroth, W. Olovsson, E. Holmstrom, R. Knut, M. Gorgoi, S. Svensson, and O. Karis Understanding interface properties from high kinetic energy photoelectron spectroscopy and first principles theory J. Electron Spectrosc. Relat. Phenom. 183 2011 80 93
20. S. Tanuma, C.J. Powell, and D.R. Penn Calculation of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M IMFP predictive equation Surf. Interface Anal. 35 2003 268 275
21. C.O.A. Olsson, and D. Landolt Atmospheric oxidation of a Nb-Zr alloy studied with XPS Corros. Sci. 46 2004 213 224
22. J.H. Scofield, Theoretical photoinonization cross sections from 1-1500 keV, Lawrence Livermore Laboratory, UCRL-51326, 1973.
23. Personal contact with VG Scienta.
24. C.O.A. Olsson, S. Malmgren, M. Gorgoi, and K. Edstrom Quantifying the metal nickel enrichment on stainless steel Electrochem. Solid State. Lett. 14 2011 C1 C3
25. V.S. Rao High-temperature oxidation behaviour of SS216L (Fe-16Cr-6Ni-6Mn-1.7Mo) Oxid. Met. 77 2012 9 15
26. A.S. Lim, and A. Atrens Esca studies of nitrogen-containing stainless-steels Appl. Phys. A: Mater. Sci. Process. 51 1990 411 418
27. S. Bera, S. Rangarajan, and S.V. Narasimhan Electrochemical passivation of iron alloys and the film characterisation by XPS Corros. Sci. 42 2000 1709 1724
28. A.R. Brooks, C.R. Clayton, K. Doss, and Y.C. Lu On the role of Cr in the passivity of stainless-steel J. Electrochem. Soc. 133 1986 2459 2464
29. C.R. Clayton, and Y.C. Lu A bipolar model of the passivity of stainless-steel - the role of Mo addition J. Electrochem. Soc. 133 1986 2465 2473
30. G. Latha, N. Rajendran, and S. Rajeswari Influence of alloying elements on the corrosion performance of alloy 33 and alloy 24 in seawater J. Mater. Eng. Perform. 6 1997 743 748
31. K. Asami, K. Hashimoto, and S. Shimodaira An XPS study of the passivity of a series of Fe-Cr alloys in sulphuric acid Corros. Sci. 18 1978 151 160
32. S. Jin, and A. Atrens Esca-studies of the structure and composition of the passive film formed on stainless-steels by various immersion times in 0.1 M Nacl solution Appl. Phys. Mater. Sci. Proc. 42 1987 149 165
33. V.S. Rao, and L.K. Singhal Electrochemical and surface analytical approach to passive film on 200 series stainless steels formed in sulfuric acid ISIJ Int. 49 2009 1902 1906
34. C. Donik, D. Mandrino, and M. Jenko Depth profiling and angular dependent XPS analysis of ultra thin oxide film on duplex stainless steel Vacuum 84 2010 1266 1269
35. P. Stefanov, D. Stoychev, M. Stoycheva, and T. Marinova XPS and SEM studies of chromium oxide films chemically formed on stainless steel 316 L Mater. Chem. Phys. 65 2000 212 215
36. V.S. Rao, and L.K. Singhal Corrosion behavior and passive film chemistry of 216L stainless steel in sulphuric acid J. Mater. Sci. 44 2009 2327 2333
37. NIST online database, http://srdata.nist.gov/xps (last accessed November 2011).
38. B. Beverskog, and I. Puigdomenech Revised Pourbaix diagrams for chromium at 25-300 degrees C Corros. Sci. 39 1997 43 57
39. C.O.A. Olsson The influence of nitrogen and molybdenum on passive films formed on the austenoferritic stainless-steel-2205 studied by Aes and Xps Corros. Sci. 37 1995 467 479
40. V. Maurice, W.P. Yang, and P. Marcus Xps and Stm investigation of the passive film formed on Cr(1 1 0) single-crystal surfaces J. Electrochem. Soc. 141 1994 3016 3027
41. D. Zuili, V. Maurice, and P. Marcus In situ scanning tunneling microscopy study of the structure of the hydroxylated anodic oxide film formed on Cr(1 1 0) single-crystal surfaces J. Phys. Chem. B 103 1999 7896 7905
42. C.Y. Chao, L.F. Lin, and D.D. Macdonald A point-defect model for anodic passive films.1. Film growth-kinetics J. Electrochem. Soc. 128 1981 1187 1194
43. L. Freire, M.J. Carmezim, M.G.S. Ferreira, and M.F. Montemor The passive behaviour of AISI 316 in alkaline media and the effect of pH: a combined electrochemical and analytical study Electrochim. Acta 55 2010 6174 6181