Core level spectroscopy of oxidized and reduced CexU 1-xO2 materials

Journal of Electron Spectroscopy and Related Phenomena

Volumn 194, Issue , 2014, Pages 66-73

  Al Salik, Y ^a   Al Shankiti, I ^a   Idriss, H ^a  

^a SAUDI BASIC INDUSTRIES CORPORATION   (Saudi Arabia)

Author keywords

Reduction of Ce cations; XPS Ce3d; XPS U4f

Indexed keywords

ARGON; BINDING ENERGY; CORE LEVELS; FLUORSPAR; MATERIALS; PHASE SEPARATION; SATELLITES; URANIUM; VALENCE BANDS; X RAY PHOTOELECTRON SPECTROSCOPY;

AR ION SPUTTERING; CORE LEVEL SPECTROSCOPY; FLUORITE STRUCTURE; ORTHORHOMBIC PHASE; PHASE SEGREGATIONS; THERMAL GENERATION; VALENCE BAND ANALYSIS; XRD;

POSITIVE IONS;

EID: 84902545182     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.11.013     Document Type: Article

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