UO2 (111) single crystal: Comparison of stoichiometric and defective surfaces by XPS

Surface Science Spectra

Volumn 13, Issue 1-4, 2006, Pages 72-80

  Senanayake, Sanjaya D ^a   Idriss, Hicham ^a  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

Argon sputtered; Hyper stoichiometric; Hypo stoichiometric; Oxygen defected; Single crystal; UO2+x; UO2 x; Uranium dioxide; Valence band

Indexed keywords

CORE-LEVEL LINES; HIGH TEMPERATURE; HYPER-STOICHIOMETRIC; HYPO-STOICHIOMETRIC; N-TYPE SEMICONDUCTORS; P TYPE SEMICONDUCTOR; PHOTOELECTRON STUDIES; UO2+X;

OXYGEN; URANIUM DIOXIDE; VALENCE BANDS;

SINGLE CRYSTALS;

EID: 37649009916     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20050601     Document Type: Article

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