TOF SIMS characterization of SEI layer on battery electrodes

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 332, Issue , 2014, Pages 368-372

  Veryovkin, I V ^a   Tripa, C E ^a   Zinovev, A V ^a   Baryshev, S V ^a,b   Li, Y ^a,c   Abraham, D P ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b EUCLID TECHLABS LLC   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

Author keywords

Depth profiling; Li ion battery; SEI layer

Indexed keywords

DEPTH PROFILING; GRAPHITE ELECTRODES; LITHIUM; LITHIUM BATTERIES; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS;

CHARGE DISCHARGE CYCLING; COMPARATIVE MODELING; DUAL-BEAM DEPTH PROFILING; LI-ION BATTERIES; LI-ION BATTERY ELECTRODES; SECONDARY ION YIELD; SEI LAYER; SIMS DEPTH PROFILE;

SEEBECK EFFECT;

EID: 84902537073     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2014.02.098     Document Type: Article

References (33)

1. E. Peled J. Electrochem. Soc. 126 1979 2047
2. D. Aurbach J. Power Sources 89 2000 206
3. J. Vetter et al. J. Power Sources 147 2005 269
4. J.B. Goodenough, and Y. Kim Chem. Mater. 22 2009 587
5. M. Winter Z. Phys. Chem. 223 2009 1395
6. P. Verma, P. Maire, and P. Novák Electrochim. Acta 55 2010 6332
7. P. Novák, J.-C. Panitz, F. Joho, M. Lanz, R. Imhof, and M. Coluccia J. Power Sources 90 2000 52
8. P. Lu, and S.J. Harris Electrochem. Commun. 13 2011 1035
9. S. Shi, P. Lu, Z. Liu, Y. Qi, L.G. Hector Jr, H. Li, and S.J. Harris J. Am. Chem. Soc. 134 2012 15476
10. F. Kong, R. Kostecki, G. Nadeau, X. Song, K. Zaghib, K. Kinoshita, and F. McLarnon J. Power Sources 97 2001 58
11. C. Johnson, J. Vaughey, M. Thackeray, T. Sarakonsri, S. Hackney, L. Fransson, K. Edström, and J.O. Thomas Electrochem. Commun. 2 2000 595
12. X.H. Liu, and J.Y. Huang Energy Environ. Sci. 4 2011 3844
13. E. Peled, D. Bar Tow, A. Merson, and L. Burstein J. New Mater. Electrochem. Syst. 3 2000 321
14. E. Peled, D. Bar Tow, A. Merson, A. Gladkich, L. Burstein, and D. Golodnitsky J. Power Sources 97 2001 52
15. H. Ota, T. Akai, H. Namita, S. Yamaguchi, and M. Nomura J. Power Sources 119 2003 567
16. D. Abraham, T. Spila, M. Furczon, and E. Sammann Electrochem. Solid-State Lett. 11 2008 A226
17. J. Światowska-Mrowiecka, F. Martin, V. Maurice, S. Zanna, L. Klein, J. Castle, and P. Marcus Electrochim. Acta 53 2008 4257
18. J.-T. Li, V. Maurice, J. Swiatowska-Mrowiecka, A. Seyeux, S. Zanna, L. Klein, S.-G. Sun, and P. Marcus Electrochim. Acta 54 2009 3700
19. J.-T. Li, J. Swiatowska, A. Seyeux, L. Huang, V. Maurice, S.-G. Sun, and P. Marcus J. Power Sources 195 2010 8251
20. J.-T. Li, J. SÍwiatowska, V. Maurice, A. Seyeux, L. Huang, S.-G. Sun, and P. Marcus J. Phys. Chem. C 115 2011 7012
21. Y. Li, M. Bettge, B. Polzin, Y. Zhu, M. Balasubramanian, and D.P. Abraham J. Electrochem. Soc. 160 2013 A3006
22. I.V. Veryovkin, W.F. Calaway, J.F. Moore, M.J. Pellin, and D.S. Burnett Nucl. Instr. Meth. Phys. Res. Sect. B 219 2004 473
23. S.V. Baryshev, A.V. Zinovev, C.E. Tripa, M.J. Pellin, Q. Peng, J.W. Elam, and I.V. Veryovkin Rapid Commun. Mass Spectrom. 26 2012 2224
24. E. Thimsen, S.V. Baryshev, A.B. Martinson, J.W. Elam, I.V. Veryovkin, and M.J. Pellin Chem. Mater. 25 2013 313
25. I.V. Veryovkin, C. Emil Tripa, and J. Pellin Phys. Procedia 1 2008 379
26. S. Baryshev, J. Klug, A. Zinovev, C. Tripa, Q. Peng, J. Elam, and I. Veryovkin Nanotechnology 24 2013 015708
27. S. Baryshev, A. Zinovev, C. Tripa, R. Erck, and I. Veryovkin Appl. Surf. Sci. 258 2012 6963
28. S.V. Baryshev, R.A. Erck, J.F. Moore, A.V. Zinovev, C.E. Tripa, and I.V. Veryovkin J. Vis. Exp.: JoVE 21 2013 e50260
29. J.F. Ziegler, M.D. Ziegler, and J.P. Biersack Nucl. Instr. Meth. Phys. Res., Sect. B 268 2010 1818
30. A. Thompson J. Electrochem. Soc. 126 1979 608
31. P. Williams Surf. Sci. 90 1979 588
32. G. Blaise, and A. Nourtier Surf. Sci. 90 1979 495
33. S. Chattopadhyay, A.L. Lipson, H.J. Karmel, J.D. Emery, T.T. Fister, P.A. Fenter, M.C. Hersam, and M.J. Bedzyk Chem. Mater. 24 2012 3038