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Volumn , Issue 72, 2013, Pages

Characterization of surface modifications by white light interferometry: applications in ion sputtering, laser ablation, and tribology experiments.

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; COMPUTER PROGRAM; INTERFEROMETRY; LOW LEVEL LASER THERAPY; MATERIALS TESTING; METHODOLOGY; SURFACE PROPERTY;

EID: 84879761965     PISSN: None     EISSN: 1940087X     Source Type: None    
DOI: 10.3791/50260     Document Type: Article
Times cited : (11)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.