Subnanosecond incubation times for electric-field-induced metallization of a correlated electron oxide

Nature Nanotechnology

Volumn 9, Issue 6, 2014, Pages 453-458

  Brockman, Justin S ^a,b   Gao, Li ^a   Hughes, Brian ^a   Rettner, Charles T ^a   Samant, Mahesh G ^a   Roche, Kevin P ^a   Parkin, Stuart S P ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC INSULATING MATERIALS; ELECTRIC SWITCHES; METAL INSULATOR BOUNDARIES; METALLIZING; SEMICONDUCTOR INSULATOR BOUNDARIES; TRANSITION METAL OXIDES; TRANSITION METALS;

CORRELATED ELECTRONS; ELECTRIC FIELD INDUCED; ELECTRIC FIELD STRENGTH; ELECTRONIC SWITCHES; INTRINSIC ELECTRONICS; METAL-TO-INSULATOR TRANSITIONS; STRONG INTERACTION; SWITCHING PROCESS;

METAL INSULATOR TRANSITION;

OXIDE;

ARTICLE; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTRON; INCUBATION TIME; MAGNETIC FIELD; OSCILLOSCOPE; PRESSURE; PRIORITY JOURNAL; PULSE GENERATOR; TEMPERATURE;

EID: 84902279057     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2014.71     Document Type: Article

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