Towards reliable charge-mobility benchmark measurements for organic semiconductors

Organic Electronics

Volumn 15, Issue 6, 2014, Pages 1263-1272

  Blakesley, James C ^a   Castro, Fernando A ^a   Kylberg, William ^a   Dibb, George F A ^a   Arantes, Caroline ^b   Valaski, Rogério ^b   Cremona, Marco ^b,c   Kim, Jong Soo ^d   Kim, Ji Seon ^d  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b INSTITUTO NACIONAL DE METROLOGIA   (Brazil)

^c PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^d IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Charge carrier mobility; Injection limited current; Mobility; Mobility benchmark; Space charge limited current

Indexed keywords

CARRIER MOBILITY; CHARGE CARRIERS; ELECTRIC CONDUCTIVITY; HALL MOBILITY; LIGHTING; ORGANIC SEMICONDUCTOR MATERIALS;

BENCHMARK MEASUREMENTS; INJECTION LIMITED CURRENTS; INTERLABORATORY STUDIES; MOBILITY MEASUREMENTS; ORGANIC SEMICONDUCTING MATERIALS; SOLID STATE LIGHTING; SOURCES OF VARIATION; SPACE CHARGE LIMITED CURRENTS;

HOLE MOBILITY;

EID: 84899448615     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2014.02.008     Document Type: Article

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