A metrology perspective on the dark injection transient current method for charge mobility determination in organic semiconductors

Journal of Applied Physics

Volumn 109, Issue 9, 2011, Pages

  Esward, T ^a   Knox, S ^a   Jones, H ^b   Brewer, P ^a   Murphy, C ^a   Wright, L ^a   Williams, J ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY AND PRECISION; CHARGE MOBILITIES; DARK INJECTION; DEVICE UNDER TEST; ELECTRICAL INPUTS; ENVIRONMENTAL CONDITIONS; KEY PARAMETERS; ORGANIC SEMICONDUCTOR DEVICES; SHORT-TERM EFFECTS; SINGLE CARRIER; SYSTEMATIC STUDY; TRANSIENT CURRENT;

ORGANIC LIGHT EMITTING DIODES (OLED); SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICES; UNCERTAINTY ANALYSIS; UNITS OF MEASUREMENT;

POWER QUALITY;

EID: 79959509117     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3580256     Document Type: Article

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