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Volumn 67, Issue 1, 2014, Pages 2-13

Defects controlled wrinkling and topological design in graphene

Author keywords

Curvature; Graphene; Incompatible growth metric field; Topological defects; von Karman equation

Indexed keywords

ATOMISTIC SIMULATIONS; CURVATURE; ELECTRICAL AND MECHANICAL PROPERTIES; METRIC FIELDS; SINUSOIDAL SURFACES; TOPOLOGICAL DEFECT; TOPOLOGICAL DESIGN; VON KARMAN EQUATIONS;

EID: 84898078423     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2014.02.005     Document Type: Article
Times cited : (166)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.