Extensive domain wall motion and deaging resistance in morphotropic 0.55Bi(Ni1/2Ti1/2)O3-0.45PbTiO3 polycrystalline ferroelectrics

Applied Physics Letters

Volumn 104, Issue 13, 2014, Pages

  Tutuncu, Goknur ^a   Fan, Longlong ^b   Chen, Jun ^b   Xing, Xianran ^b   Jones, Jacob L ^c  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC AND PIEZOELECTRIC PROPERTIES; ELECTRIC-FIELD AMPLITUDE; HIGH ENERGY X-RAY DIFFRACTION; IN-SITU MEASUREMENT; MORPHOTROPIC PHASE BOUNDARIES; POLYCRYSTALLINE FERROELECTRICS; STRONG ELECTRIC FIELDS; STRUCTURE AND PROPERTIES;

ALIGNMENT; FERROELECTRIC CERAMICS; FERROELECTRIC MATERIALS; NICKEL; X RAY DIFFRACTION;

ELECTRIC FIELD EFFECTS;

EID: 84898062198     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4870506     Document Type: Article

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