Origins of electro-mechanical coupling in polycrystalline ferroelectrics during subcoercive electrical loading

Journal of the American Ceramic Society

Volumn 94, Issue 2, 2011, Pages 293-309

  Pramanick, Abhijit ^a,b   Damjanovic, Dragan ^c   Daniels, John E ^d,e   Nino, Juan C ^a   Jones, Jacob L ^a  

^a University of Florida   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c EPFL   (Switzerland)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; ATOMIC LEVELS; DIFFRACTION DATA; DOMAIN WALL MOTION; ELECTRIC-FIELD AMPLITUDE; ELECTRICAL LOADING; ELECTROMECHANICAL PROPERTY; FE-DOPED; GRAIN INTERACTION; HIGH ENERGY; IN-SITU; INTERGRANULAR INTERACTION; INTERPHASE BOUNDARIES; LATTICE STRAIN; MATERIAL RESPONSE; MICROSCOPIC LEVELS; NANOSCALE LEVELS; PHENOMENOLOGICAL APPROACH; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC PROPERTY; POLYCRYSTALLINE AGGREGATES; POLYCRYSTALLINE FERROELECTRICS; RAYLEIGH; SINGLE-CRYSTALLINE MATERIALS; STRONG CORRELATION; STRUCTURAL MECHANISMS; TIME-RESOLVED X-RAY DIFFRACTION;

DIFFRACTION; ELECTRIC FIELDS; ELECTROMECHANICAL COUPLING; ELECTROMECHANICAL DEVICES; FERROELECTRICITY; MATERIALS PROPERTIES; PIEZOELECTRICITY; POLYCRYSTALLINE MATERIALS; WALLS (STRUCTURAL PARTITIONS); X RAY DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 79751533161     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04240.x     Document Type: Article

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