Time-resolved characterization of ferroelectrics using high-energy X-ray diffraction

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 56, Issue 8, 2009, Pages 1539-1545

  Daniels, John E ^a   Pramanick, Abhijit ^b   Jones, Jacob L ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED LOADS; ELECTRIC LOADING; HIGH ENERGY; HIGH ENERGY X-RAY DIFFRACTION; MATERIAL BEHAVIOR; SINUSOIDAL WAVEFORMS; SQUARE WAVEFORM; STEP FUNCTIONS; STRUCTURAL RESPONSE; TIME-RESOLVED CHARACTERIZATION; TIME-RESOLVED DIFFRACTION; WAVE FORMS; X-RAY ENERGIES;

DIFFRACTION; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; FERROELECTRICITY; STRUCTURAL CERAMICS;

FERROELECTRIC CERAMICS;

EID: 68649114620     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2009.1218     Document Type: Conference Paper

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