A modified Rietveld method to model highly anisotropic ceramics

Acta Materialia

Volumn 60, Issue 4, 2012, Pages 1494-1502

  Tutuncu, G ^a,c   Motahari, M ^a   Daymond, M R ^b   Ustundag, E ^a  

^a Iowa State University   (United States)

^b QUEEN S UNIVERSITY   (Canada)

^c UNIVERSITY OF FLORIDA   (United States)

Author keywords

Piezoelectricity; Rietveld; X ray diffraction

Indexed keywords

CONSTITUTIVE BEHAVIORS; DIFFRACTION DATA; DOMAIN SWITCHINGS; ELASTIC ANISOTROPY; ELECTRICAL LOADING; HIGH ENERGY X-RAY DIFFRACTION; HIGH STRAINS; LATTICE STRAIN; MULTIPLE SAMPLES; PB(ZR , TI)O; POLYCRYSTALLINE FERROELECTRICS; PZN-PZT; RIETVELD; TEXTURE ANALYSIS; TEXTURE EVOLUTIONS; TRANSMISSION GEOMETRIES; TWO-DIMENSIONAL DETECTORS;

CERAMIC MATERIALS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; LEAD; PIEZOELECTRICITY; RIETVELD METHOD; TEXTURES; X RAY DIFFRACTION; ZIRCONIUM;

ANISOTROPY;

EID: 84856183661     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.11.050     Document Type: Article

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