Univariate and multivariate process yield indices based on location-scale family of distributions

International Journal of Production Research

Volumn 52, Issue 11, 2014, Pages 3348-3365

  Dharmasena, L S ^a   Zeephongsekul, P ^b  

^a DEAKIN UNIVERSITY   (Australia)

^b RMIT UNIVERSITY   (Australia)

Author keywords

asymptotic properties; location scale family of distributions; process yield; univariate and multivariate yield indices

Indexed keywords

MATHEMATICAL MODELS; PRODUCTION ENGINEERING;

ASYMPTOTIC PROPERTIES; LOCATION-SCALE FAMILIES; MULTIVARIATE PROCESS; PROCESS CAPABILITIES; PROCESS CHARACTERISTICS; PROCESS YIELD; STATISTICAL INFERENCE; UNIVARIATE;

NORMAL DISTRIBUTION;

EID: 84898013894     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207543.2013.874604     Document Type: Article

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