Backscattered electron SEM imaging of cells and determination of the information depth

Journal of Microscopy

Volumn 254, Issue 2, 2014, Pages 75-83

  Seiter, J ^a   Muller E ^a   Blank, H ^a   Gehrke, H ^b   Marko, D ^b   Gerthsen, D ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

Backscattered electron imaging; Charging effects; HT29 cells; Indium tin oxide coated glass; Information depth; Low electron energy; Scanning electron microscopy

Indexed keywords

BACKSCATTERING; CYTOLOGY; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; GLASS; GLASS SUBSTRATES; INDIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SILICA NANOPARTICLES; TIN OXIDES;

BACKSCATTERED ELECTRON IMAGING; BACKSCATTERED ELECTRONS; CHARGING EFFECT; COLON CARCINOMA CELLS; ELECTRONS ENERGY; HT-29 CELLS; INDIUM TIN OXIDE COATED GLASS; INFORMATION DEPTH; LOW ELECTRON ENERGY; SEM IMAGING;

CELLS;

INDIUM; TIN OXIDE; NANOPARTICLE; SILICON DIOXIDE;

ARTICLE; BACKSCATTERED ELECTRON; BACKSCATTERED ELECTRON IMAGING; CALCULATION; CANCER CELL CULTURE; CELL SECTION; CELL STRAIN HT29; CELL ULTRASTRUCTURE; CHEMOSENSITIVITY; CYTOLOGY; ELECTRON; ENERGY; HUMAN; HUMAN CELL; INFORMATION DEPTH; PHYSICAL PARAMETERS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY; THICKNESS; MICROTOMY; PROCEDURES; TUMOR CELL LINE;

CELL LINE, TUMOR; HUMANS; MICROSCOPY, ELECTRON, SCANNING; MICROTOMY; NANOPARTICLES; SILICON DIOXIDE;

EID: 84897963427     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12120     Document Type: Article

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