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Volumn 38, Issue 12, 2013, Pages 1065-1071

In situ high-resolution transmission electron microscopy of material reactions

Author keywords

Amorphous; Annealing; Chemical reaction; Thin film; Transmission electron microscopy

Indexed keywords

ELEVATED TEMPERATURE; HAFNIUM SILICATES; KINETIC MEASUREMENT; METAL-INDUCED CRYSTALLIZATION; METAL-SILICON INTERFACES; SOLID PHASE EPITAXIAL REGROWTH; SOLID-STATE AMORPHIZATION; THERMALLY ACTIVATED;

EID: 84897873534     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2013.285     Document Type: Review
Times cited : (30)

References (43)
  • 8
    • 84897825318 scopus 로고
    • PhD degree thesis, Stanford University
    • M.A. Parker, PhD degree thesis, Stanford University (1988).
    • (1988)
    • Parker, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.