Seeing in 4D with electrons: Development of ultrafast electron microscopy at Caltech

Comptes Rendus Physique

Volumn 15, Issue 2-3, 2014, Pages 176-189

  Baskin, J Spencer ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Atomic steps; Electron microscopy; Near field; PINEM

Indexed keywords

EID: 84897670389     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2013.11.002     Document Type: Short Survey

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