Additive sintering, postannealing, and dielectric properties of SrTaO 2 N

Journal of the American Ceramic Society

Volumn 97, Issue 4, 2014, Pages 1023-1027

  Sun, Shi Kuan ^a   Zhang, Ya Ru ^a   Masubuchi, Yuji ^a   Motohashi, Teruki ^a   Kikkawa, Shinichi ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; ANNEALING; CERAMIC MATERIALS; DIELECTRIC LOSSES; NITROGEN; RECOVERY;

CHEMICAL COMPOSITIONS; LARGE DIELECTRIC CONSTANT; LOW DIELECTRIC LOSS; NITROGEN CONTENT; POST ANNEALING; RELATIVE DENSITY; SEMICONDUCTING BEHAVIOR; SINTERING ADDITIVES;

SINTERING;

EID: 84897576718     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/jace.12806     Document Type: Article

References (24)

1. 2+ Powder Phosphors for White Light-Emitting Diodes," Appl. Phys. Lett., 86 [21] 211905, 3pp (2005).
2. R. Mueller-Mach, G. Mueller, M. R. Krames, H. A. Höppe, F. Stadler, W. Schnick, T. Juestel, and, P. Schmidt, " Highly Efficient all-Nitride Phosphor-Converted White Light Emitting Diode," Phys. Status Solidi A, 202 [9] 1727-32 (2005).
3. 2N Under Visible Light Irradiation," J. Phys. Chem. A, 106 [29] 6750-3 (2002).
4. 2N as a Visible-Light (≤600 nm)-Driven Photocatalyst (2)," J. Phys. Chem. B, 107 [3] 791-7 (2002).
5. T. Motohashi, M. Ito, Y. Masubuchi, M. Wakeshima, and, S. Kikkawa, " Crystal Structure and Superconducting Properties of Hexagonal Lithium-Niobium Oxynitride," Inorg. Chem., 51 [20] 11184-9 (2012).
6. y) Where M=Mg, Si, and x≈y," J. Solid State Chem., 184 [8] 2061-5 (2011).
7. 2N (A = Ba, Sr, Ca; M = Ta, Nb)," Chem. Mater., 16 [7] 1267-76 (2004).
8. 2N," J. Ceram. Soc. Jpn., 119 [7] 581-6 (2011).
9. 2N Ceramics," J. Eur. Ceram. Soc., 32 [6] 1269-74 (2012).
10. 2N Ceramics," Ceram. Int., 39 [3] 3377-80 (2013).
11. 0.9," J. Solid State Chem., 180 [11] 3224-33 (2007).
12. M. Zenotchkine, R. Shuba, and, I.-W. Chen, " Effect of Seeding on the Microstructure and Mechanical Properties of α-SiAlON: III, Comparison of Modifying Cations," J. Am. Ceram. Soc., 86 [7] 1168-75 (2003).
13. 4/BN Ceramics Prepared via Nitridation of Silicon Powder," J. Am. Ceram. Soc., 94 [3] 666-70 (2011).
14. M. Yang, J. Oro-Sole, J. Rodgers, A. Jorge, A. Fuertes, and, J. Attfield, " Anion Order in Perovskite Oxynitrides," Nat. Chem, 3 [4] 7-52 (2011).
15. 2N," Chem. Mater., 24 [22] 4343-9 (2012).
16. S. G. Ebbinghaus, R. Aguiar, A. Weidenkaff, S. Gsell, and, A. Reller, " Topotactical Growth of Thick Perovskite Oxynitride Layers by Nitridation of Single Crystalline Oxides," Solid State Sci., 10 [6] 709-16 (2008).
17. S. G. Ebbinghaus, H.-P. Abicht, R. Dronskowski, T. Müller, A. Reller, and, A. Weidenkaff, " Perovskite-Related Oxynitrides-Recent Developments in Synthesis, Characterisation and Investigations of Physical Properties," Prog. Solid State Chem., 37 [23] 173-205 (2009).
18. " Standard Test Method for Water Absorption, Bulk Density, Apparent Porosity, and Apparent Specific Gravity of Fired Whiteware Products "; ASTM Designation C373-88. American Society for Testing and Materials, West Conshohocken, PA.
19. R. Aguiar, D. Logvinovich, A. Weidenkaff, A. Reller, and, S. Ebbinghaus, " Thermal Oxidation of Oxynitride Perovskites in Different Atmospheres," Thermochim. Acta, 471 [1-2] 55-60 (2008).
20. B. Eck, R. Dronskowski, M. Takahashi, and, S. Kikkawa, " Theoretical Calculations on the Structures, Electronic and Magnetic Properties of Binary 3d Transition Metal Nitrides," J. Mater. Chem., 9, 1527-37 (1999).
21. J. Irvine, D. C. Sinclair, and, A. West, " Electroceramics: Characterization by Impedance Spectroscopy," Adv. Mater., 2 [3] 132-8 (1990).
22. 3 Ceramics," J. Am. Ceram. Soc., 90 [4] 1327-30 (2007).
23. 15 Ceramics," Phys. Status Solidi A, 208 [5] 1047-51 (2011).
24. 3 Internal Boundary Layer Capacitors During and After Processing and Resultantelectrical Properties," J. Am. Ceram. Soc., 68 [4] 169-73 (1985).