An improved method for simultaneous small-signal and noise characterization of two-ports using multi-state radiometer

1999 29th European Microwave Conference, EuMC 1999

Volumn 2, Issue , 1999, Pages 61-64

  Schmidt Szałowski, Marek ^a   Wiatr, Wojciech ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; RADIOMETERS;

LOW NOISE; MEASUREMENT SYSTEM; MULTI-STATE; NOISE CHARACTERIZATION; NOISE CONTRIBUTIONS; NOISE PARAMETERS; NOISE POWER;

PARAMETER ESTIMATION;

EID: 84897515065     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1999.338409     Document Type: Conference Paper

References (15)

1. V. Adamian, A. Uhlir. A novel procedure for receiver noise characterization. IEEETrans. Instrum.Meas.22,181-182(1973).
2. J. W. Archer, R. A. Batchelor. Fully automated on-wafer noise characterization of GaAs MESFET' s and HEMT s. IEEE Trans. Microwave Theory Tech. 40 (2X 209-216 (1992).
3. A. C. Davidson, B. W. Leake. Accuracy improvements in microwave measurement of noise parameterss. IEEE Trans. Microwave Theory Tech.37,1973-1977 (1989).
4. G. Martines, M. Sannino. Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only. IEEE Trans. Instrum. Meas. 34 (IX 89-91 (1985).
5. G. Martines, M. Sannino. The determination of the noise, gain and scattering parameters of microwave transistors (HEMT's) using only an automatic noise figure test-set. IEEE Trans. Microwave Theory Tech.42 (7), 1105-1113(1994).
6. M. W. Pospieszalski. Modeling of noise parameters of MESFETs and MODFET's and their frequency and temperature dependence. IEEE Trans. Microwave Theory Tech. 37 (9), 1340-1350 (1989).
7. R. Stolle, B. Schiek. The complete and accurate determination of two-port noise parameters without separate measurement of the two-port input impedance, pages 241-246. EuMC'98, 1998.
8. W. Wiatr. A method for embedding network characterization with application to low-loss measurement. IEEE Trans. Instrum. Meas. 36, 487-490 (1987).
9. W. Wiatr. Concepts of de-embedding and unterminating based on the noise power measurements. Bulletin of the Polish Academy of Sciences, Technical Sciences 41 (1), 1-8 (1993).
10. W. Wiatr. High accuracy characterization of two-ports in noise measurement system, pages 65-69. MIOP'93, Sindelfingen, 1993.
11. W. Wiatr. Characterization of radiometer using eight-term linear model. IEEE Trans. Instrum. Meas. 44 (2X 343-346 (1995X
12. W. Wiatr. The multistate radiometry: Noise de-embedding and un-terminating. IEEE Trans. Instrum. Meas. 46 (2), 503-506 (1997X
13. W. Wiatr, M. Schmidt-Szalowski. Measurement of the transistor noise parameters using multi-state radiometer syste?n, pages 178-181. EuMC'96,1996.
14. W. Wiatr, M. Schmidt-Szalowski. The multistate radiometer: A novel means for impedance and noise temperature measurement. IEEE Trans. Instrum. Meas. 46 (2), 486-489 (1997).
15. W. Wiatr, M. Schmidt-Szalowski. The multistate radiometer: A novel means for broadband noise and small-signal characterization of microwave semiconductor devices, pages 171-180. ARFTG'97, 1997.