The Multistate Radiometer: A Novel Means for Broadband Noise and Small-Signal Characterization of Microwave Semiconductor Devices

49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems

Volumn , Issue , 1997, Pages 171-180

  Wiatr, Wojciech ^a   Schmidt Szalowski, Marek ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM ARSENIDE; III-V SEMICONDUCTORS; MIXER CIRCUITS; RADIOMETERS;

ACCURACY ENHANCEMENT; AUTOMATIC MEASUREMENTS; BROADBAND NOISE; IMPEDANCE STANDARDS; NEW APPROACHES; NOISE MEASUREMENTS; NOISE TEMPERATURE; SIGNAL CHARACTERIZATION;

SEMICONDUCTOR DEVICES;

EID: 84897539951     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1997.327226     Document Type: Conference Paper

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