The complete and accurate determination of two-port noise parameters without seperate measurements of the two-port input impedance

1998 28th European Microwave Conference, EuMC 1998

Volumn 1, Issue , 1998, Pages 241-246

  Stolle, Reinhard ^a   Schiek, Burkhard ^a  

^a Arbeitsgruppe HF Mebtechnik Universitätsstrabe 150   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT;

DEVICE UNDER TEST; IMPEDANCE MEASUREMENT; INPUT IMPEDANCE; MEASUREMENTS OF; NOISE PARAMETERS; NONLINEAR RELATIONS; STATE OF THE ART; TWO-PORT NOISE;

PARAMETER ESTIMATION;

EID: 84897528891     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1998.337994     Document Type: Conference Paper

References (4)

1. Lane, R. Q. , "The Determination of Device Noise Parameters, " IEEE Proceedings, pp. 1461 - 1462, August 1969.
2. Adamian, V. , Uhlir, A. Jr. , "A Novel Procedure for Receiver Noise Characterization, " IEEE Trans. Instrum. Meas. , pp. 181 - 182, June 1973.
3. Davidson, A. C, Leake, B. W. , Strid, E. , "Accuracy Improvements in Microwave Noise Parameter Measurements, " IEEE Trans. Microwave Theory and Tech. , pp. 1973 - 1978, December 1989.
4. Bareau, P. , Abdipour, A. , Pacaud, A. , "A New Noise Measurement Method of Noise Parameters at Microwave Frequencies, " IEEE Trans. Instrum. Meas. , pp. 1044 - 1048, August 1997.