Measurement of the transistor noise parameters using multi-state radiometer system

1996 26th European Microwave Conference, EuMC 1996

Volumn 1, Issue , 1996, Pages 178-181

  Wiatr, Wojciech ^a   Schmidt Szalowski, Marek ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; MICROWAVE DEVICES;

ACCURACY ENHANCEMENT; MEASUREMENT TECHNIQUES; MICROWAVE TRANSISTORS; NOISE CHARACTERIZATION; NOISE EXCITATION; NOISE MEASUREMENTS; NOISE TEMPERATURE; TRANSISTOR NOISE;

RADIOMETERS;

EID: 0006570611     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1996.337547     Document Type: Conference Paper

References (12)

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