W-band on-wafer noise parameter measurements

2001 31st European Microwave Conference, EuMC 2001

Volumn , Issue , 2001, Pages

  Vaha Heikkila, Tauno ^a   Lahdes, Manu ^a   Tuovinen, Jussi ^a   Kantanen, Mikko ^a   Kangaslahti, Pekka ^b,c   Jukkala, Petri ^b   Hughes, Nicholas ^b  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^b Ylinen Electronics Ltd   (Finland)

^c AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY BANDS; LOW NOISE AMPLIFIERS;

ACTIVE DEVICES; EARTH OBSERVATIONS; INP HEMT; LOW NOISE RECEIVERS; NOISE MODELS; NOISE PARAMETERS; SPACE MISSIONS; VERY LOW NOISE RECEIVERS;

PARAMETER ESTIMATION;

EID: 84897481148     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.2001.338936     Document Type: Conference Paper

References (10)

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