60 GHz On-wafer noise parameter measurements using cold-source method

49th ARFTG Conference Digest - Spring 1997: Characterization of Broadband Telecommunications Components and Systems

Volumn , Issue , 1997, Pages 146-154

  Lahdes, Manu ^a   Sipila, Markku ^a   Tuovinen, Jussi ^a  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

III-V SEMICONDUCTORS; INDIUM PHOSPHIDE; SEMICONDUCTING INDIUM PHOSPHIDE;

INP HEMT; NOISE PARAMETERS; ON-WAFER;

PARAMETER ESTIMATION;

EID: 84884793567     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1997.327223     Document Type: Conference Paper

References (9)

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