The determination of on-wafer noise parameters at W-band

1997 27th European Microwave Conference, EuMC 1997

Volumn 2, Issue , 1997, Pages 687-691

  Alam, Tariq A ^a   Pollard, Roger D ^a   Snowden, Christopher M ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION MATRIX; NOISE PARAMETERS; ON-WAFER; ON-WAFER DEVICES;

SCATTERING PARAMETERS; SIGNAL NOISE MEASUREMENT;

CALCULATIONS; ELECTRIC ATTENUATORS; ELECTROMAGNETIC WAVE SCATTERING; MATRIX ALGEBRA; SIGNAL RECEIVERS;

CORRELATION MATRICES; ON WAFER ATTENUATOR;

EID: 0031378154     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1997.337873     Document Type: Conference Paper

References (7)

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5. R.Q. Lane, "The Determination of Device Noise Parameters ", Proc. IRE, Vol.57, pp.1461-1462, August 1969
6. L. Boglione, R.D. Pollard, V. Postoyalko, T.A. Alam,"Specjficatjons for a Linear Network Simultaneously Noise and Available-Power Matched" , IEEE Microwave and Guided Letters, Vol.6, No. "pp. 407-409, November 1996
7. J.C. Medley, "Towards Traceability for Adaptor measurements " , ARMMS Conference, Bath, November 1996