Uncertainty analysis of v-band on-wafer noise parameter measurement system

1998 28th European Microwave Conference, EuMC 1998

Volumn 1, Issue , 1998, Pages 445-450

  Lahdes, M ^a  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENTS;

INP HEMT; MONTE CARLO ANALYSIS; NOISE PARAMETERS; ON-WAFER; UNCERTAINTY BUDGET;

UNCERTAINTY ANALYSIS;

EID: 0037491799     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1998.338030     Document Type: Conference Paper

References (7)

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3. Strid E.: "Noise measurements for low-noise GaAs FET amplifiers", Microwave System News, vol. 10, pp. 62-70, 1981.
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5. Lane R. Q.: "The determination of device noise parameters", Proceedings of the IEEE, vol. 57, no. 8, pp. 1461-1462,1969.
6. Adamian V.: "Calibration, measurement, and accuracy of the noise parameter measurements", IEEE 1996 MTT-S International Microwave Symposium workshop proceedings "Making accurate on-wafer measurements", pp.83-110, 1996.
7. Pospiezalski M.: "Modelling of noise parameters of MESFETS's and MODFET's and their frequency and temperature dependence", IEEE Transactions on Microwave Theory and Techniques, vol. 37, no. 9, pp. 1340-1350,1989.